ITC Program Page
It is our privilege to welcome you to the 47th International Test Conference (ITC) sponsored by IEEE and the IEEE Philadelphia Section. ITC is the world’s premier conference dedicated to electronics test. Our volunteer committees worked very hard to provide to you an exciting event with a balance of the latest research, practical applications, and networking opportunities. We are holding ITC in Fort Worth, Texas the week of November 14, 2016.
Our topics include heterogeneous integration, high-speed interface, emerging devices, emerging test needs for automotive and IoT, hardware security, system test, analog and mixed-signal test, ATE, yield learning, test analytics, pre-silicon test optimization, test cost, test methodology, test standards, and industrial practices.
Best Paper Award
The Best Paper Award has been renamed, the ITC Ned Kornfield Best Paper Award in honor of Dr. Nathanial “Ned” Kornfield, ITC’s founder and longtime Chairman Emeritus.
To encourage excellence in its technical program, ITC presents awards to authors of outstanding papers presented at ITC and published in the proceedings. In determining award-winning papers, the ITC Awards Selection Committee considers the quality of the papers as published in the Proceedings and as presented at the conference technical sessions. The committee’s decisions are based on responses by conference attendees as recorded on session rating cards and on the observations and recommendations of the ITC Program Committee.
Visit the Awards Page for a list of past ITC Ned Kornfield Best Paper Award winners.