The world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.
Each year ITC honors contributions made by industry leaders and innovators. Those who have made a real impact. Please view the awards portion of the Plenary and give each recipient a round of applause!
http://www.itc-testweek.org/wp-content/uploads/2017/01/itc_button-with-verbiage.png00Jill Siberthttp://www.itc-testweek.org/wp-content/uploads/2017/01/itc_button-with-verbiage.pngJill Sibert2016-12-29 07:01:292017-01-06 06:39:22ITC 2016 in the News